신소재 현미경 레포트(report)
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작성일 19-06-17 05:31
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신소재 현미경 레포트 , 신소재 현미경 레포트기타레포트 , 신소재 현미경 레포트
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순서
신소재,현미경,레포트,기타,레포트
AFM
1.principles
-The AFM consists of a cantilever with a sharp tip (probe) at its end that is used
to scan the specimen surface. The cantilever is typically silicon or silicon nitride
with a tip radius of curvature on the order of nanometers. When the tip is
brought into proximity of a sample surface, forces between the tip and the
sample lead to a deflection of the cantilever according to Hooke`s law. Depending
on the situation, forces that are measured in AFM include mechanical contact
force, van der Waals forces, capillary forces, chemical bonding, electrostatic
forces, magnetic forces , Casimir forces, solvation forces, etc. Along with force,
additional quantities may simultaneously be measured through the use of
specialized types of probe . Typically, the deflection is measured using a laser spot reflected from the top surface of the cantilever into an array of photodiodes. Other methods that are used include optical interferometry, capaci…(생략(省略))
설명
레포트/기타
신소재 현미경 레포트(report)
신소재 현미경 레포트(report)
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